TeraLyzer - Advanced THz Time Domain Spectroscopy Data Extraction

The TeraLyzer is a first-of-its-kind software solution for material parameter extraction from terahertz time domain spectroscopy data, delivering highly precise information of the complex material parameters of a sample, (n, α, κ, ε', ε'') complete with error bars and the estimated sample thickness.

The TeraLyzer incorporates multiple powerful procedures. First, your experimental data is fed into a time domain pre-processor, which minimizes jitter and amplitude drift induced errors, removes signal offsets and offers windowing functionality. In the second step, the data range with reliable information is evaluated. Finally, you can chose between two state-of-the-art data extraction approaches previously discussed in the literature: The Quasi Space [1] and the Total Variation [2] method.

As demonstrated below, thin samples in the sub-100μm regime become accessible to your research without the need for differential measuring setups. Best of all, you can also analyze multilayer systems with the TeraLyzer, opening the door for a whole new range of experiments.



  • Simultaneous extraction of the thickness and the optical parameters from transmission THz time domain spectroscopy measurements
  • Thickness determination is performed by either of two sophisticated algorithms considering Fabry Perot reflections: The Quasi Space [1] or the Total Variation [2] method
  • The Quasi Space method enables the characterization of sub-100μm samples
  • Accurate thickness determination is also possible even if the sample is inaccessible, e.g. inside a cryostat
  • Multilayer sample support: A single unknown layer within a multilayer system can be characterized
  • A statistical error propagation model delivers reliable error bars for n, α,κ, ε' and ε''
  • Dynamic range consideration for highly absorbing samples according to [3]
  • Versatile time domain preprocessing features are included (e.g. flexible windowing, offset removal, phase correction)


[1] M. Scheller, C. Jansen, and M. Koch, Optics Communications, Volume 282, Issue 7, 1 April 2009, Pages 1304-1306
[2] I. Pupeza, R. Wilk, and M. Koch, Optics Express, Volume 15, Issue 7, 2 April 2007, Pages 4335-4350
[3] P. U. Jepsen and B. M. Fischer, Opt. Lett. 30, 2005, Pages 29-31



Interested in what the TeraLyzer can do for you? We offer to analyze up to three of your data sets free of charge and to provide you with most accurate material parameters of your sample. Please contact us for more detailed information.